CHILD DEVELOPMENT PEDAGOGY

Detailed explanation-1: -The Binet–Simon scale was created by the French psychologist Alfred Binet and his student Theodore Simon. Due to changing education laws of the time, Binet had been requested by a government commission to come up with a way to detect children who were falling behind developmentally and in need of help.

Detailed explanation-2: -The Stanford-Binet Intelligence Scale was first developed in 1905 by French psychologist Alfred Binet and his collaborator Theodore Simon to test the attention, memory, and verbal skill of schoolchildren and thereby measure their intelligence.

Detailed explanation-3: -intelligence testing The Stanford-Binet is the American adaptation of the original French Binet-Simon intelligence test; it was first introduced in 1916 by Lewis Terman, a psychologist at Stanford University. The individually administered test-revised in 1937, 1960, 1973, 1986, and 2003-evaluates… …

Detailed explanation-4: -In 1905, psychologists Alfred Binet and Théodore Simon designed a test for children who were struggling in school in France. Designed to determine which children required individualized attention, their method formed the basis of the modern IQ test.

Detailed explanation-5: -Alfred Binet (French: [binɛ]; 8 July 1857 – 18 October 1911), born Alfredo Binetti, was a French psychologist who invented the first practical IQ test, the Binet–Simon test.