HORTICULTURE

Detailed explanation-1: -The scanning tunneling microscope (STM) is among a number of instruments that allows scientists to view and manipulate nanoscale particles, atoms, and small molecules.

Detailed explanation-2: -The Atomic Force Microscope (AFM), which can be considered as being at the heart of nanotechnology, was invented by Binnig, Quate, and Gerber in 1986; 1989 saw the production of the first commercial AFM. AFM is one of the foremost tools used for imaging, measuring, and manipulating matter at the nanoscale.

Detailed explanation-3: -An atomic force microscope (AFM) is a magnifying observation tool capable of measuring 3D textures of a minuscule area. Unlike scanning electron microscopes, it can acquire height data in numeric values, which enable quantification of sample and data post-processing.

Detailed explanation-4: -To view and manipulate nanoscale objects, including individual atoms and molecules, some high-powered electron microscopes use very tiny, sharp tips that move across the surface of the object. This method is called scanning probe microscopy (SPM).

Detailed explanation-5: -The Atomic Force Microscope (AFM) allows for 3D characterization of nanoparticles with sub-nanometer resolution. Nanoparticle characterization using Atomic Force Microscopy has a number of advantages over dynamic light scattering, electron microscopy and optical characterization methods.